Xiaohui Si

IEEE Transactions on Reliability · 2012

A researcher in the Science corpus: 1 paper; trusts 1 researcher and is trusted by 0 researchers here, as inferred from the citation graph.

Whom Xiaohui Si trusts overall

Their strongest outbound trust, strongest first, inferred from their citations.

  1. Hirotugu Akaike
  2. Nikhil M. Vichare
  3. Xiaosheng Si
  4. Xiao Wang
  5. Michael G. Pecht
  6. Wenbin Wang

Who trusts Xiaohui Si overall

  1. Z. Ye
  2. Min Xie

Papers from Xiaohui Si's perspective

Ordered by how strongly the researchers Xiaohui Si trusts endorse each paper. Same corpus, a different order for every researcher.

  1. Threshold Regression for Survival Analysis: Modeling Event Times by a Stochastic Process Reaching a Boundary
  2. Mis-Specification Analysis of Linear Degradation Models (IEEE Transactions on Reliability)
  3. Optimal burn-in policy by using an integrated Wiener process
  4. A new look at the statistical model identification
  5. The Statistical Analysis of Failure Time Data (Technometrics)
  6. An Inverse Gaussian Process Model for Degradation Data (Technometrics)
  7. Estimating failure time distribution and its parameters based on intermediate data from a Wiener degradation model
  8. Prognostics and health management of electronics (IEEE transactions on components and packaging technologies)
  9. Remaining useful life estimation - A review on the statistical data driven approaches (European Journal of Operational Research)
  10. Prognostics and health management of electronics (International Symposium on Advanced Packaging Materials)

Their papers