Remaining Useful Life Estimation Based on a Nonlinear Diffusion Degradation Process

By Xiaohui Si, Wenbin Wang, Changhua Hu, Donghua Zhou, Michael G. Pecht. IEEE Transactions on Reliability, 2012

295 citations recorded by the source corpus.

View Paper: https://www.semanticscholar.org/paper/9aa6e0bc37b2fb3089d99d692e48ae6ff6077ebb

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1. Min Xie
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Citations in the corpus

• Stochastic modelling and analysis of degradation for highly reliable products (2015, methodology): “[25] adopted the same random-drift Wiener process model to analyse gyroscopic drift data in an inertial”