Mis-Specification Analysis of Linear Degradation Models

By Chien‐Yu Peng, S. Tseng. IEEE Transactions on Reliability, 2009

370 citations recorded by the source corpus.

Subfields: Safety, Risk, Reliability and Quality, Software, Statistics and Probability

View Paper: https://www.semanticscholar.org/paper/99e2f536463f0b9f43d3124b684900a1b2977163

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In Safety, Risk, Reliability and Quality

1. Z. Ye
2. Min Xie
3. Kwok Leung Tsui
4. Xiaosheng Si
5. Changhua Hu
6. Donghua Zhou
7. Wenbin Wang
8. Xue Wang

In Software

1. Z. Ye
2. Min Xie
3. Michael G. Pecht
4. Donghua Zhou
5. Kwok Leung Tsui
6. Changhua Hu
7. Wei Yan
8. Yimin Shi

In Statistics and Probability

1. Z. Ye
2. Kwok Leung Tsui
3. Min Xie
4. Donghua Zhou
5. Michael G. Pecht
6. Changhua Hu
7. Yanyang Zi
8. Xiaohui Si

Citations in the corpus

• Degradation Data Analysis Using Wiener Processes With Measurement Errors (2013, neutral): “Section VII concludes the paper.”
• Remaining Useful Life Estimation Based on a Nonlinear Diffusion Degradation Process (2012, methodology): “We refer to the model presented by Peng and Tseng [53] as below.”
• Remaining Useful Life Prediction of Lithium-Ion Batteries Based on the Wiener Process with Measurement Error (2014, methodology): “Peng and Tseng [31] presented a MLE method to estimate the unknown parameters of the WPME.”
• Real-time reliability evaluation of two-phase Wiener degradation process (2017, methodology): “Peng and Tseng (2009) utilized this model to capture the degradation of laser devices and then investigated the effects of model mis-specification when the degradation model was misused.”
• Stochastic modelling and analysis of degradation for highly reliable products (2015, methodology): “by Peng and Tseng [13], and was found a good fit to the famous GaAs laser degradation data in Meeker and Escobar”
• Remaining useful life estimation - A review on the statistical data driven approaches (2011, methodology): “Along the line of the work by Whitmore ( 1986 , 1995 ) , Peng and Tseng ( 2009 ) incorporated the random effect of a drift coefficient and measurement errors into a Wiener process - based degradation process for lifetime assessment .”
• A Two-Stage Data-Driven-Based Prognostic Approach for Bearing Degradation Problem (2016, methodology): “beam [31], and light-emitting diode [32]–[34], to name a few.”