L. Krause

Journal of Applied Crystallography · 2015

A researcher in the Science corpus: 1 paper; trusts 3 researchers and is trusted by 0 researchers here, as inferred from the citation graph.

Whom L. Krause trusts overall

Their strongest outbound trust, strongest first, inferred from their citations.

  1. G. Sheldrick
  2. Philip R. Evans
  3. C. Hübschle
  4. T. Schulz
  5. G. Murshudov

Papers from L. Krause's perspective

Ordered by how strongly the researchers L. Krause trusts endorse each paper. Same corpus, a different order for every researcher.

  1. A short history of SHELX.
  2. Global Indicators of X-ray Data Quality
  3. A comparison of a microfocus X‐ray source and a conventional sealed tube for crystal structure determination
  4. Changing and challenging times for service crystallography
  5. Charge-coupled device area x-ray detectors
  6. How good are my data and what is the resolution?
  7. ShelXle: a Qt graphical user interface for SHELXL (Journal of Applied Crystallography)
  8. High-resolution structure of a retroviral protease folded as a monomer
  9. Structure validation by Cα geometry: ϕ,ψ and Cβ deviation
  10. International Tables for Crystallography

Their papers