Scanning probe microscopes go video rate and beyond
By M. Rost, L. Crama, P. Schakel, E. V. Tol, G. B. E. M. V. Velzen-Williams, C. F. Overgauw, H. T. Horst, H. Dekker, B. Okhuijsen, M. Seynen and 8 more. 2005
219 citations recorded by the source corpus.
Subfields: Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering
View Paper: https://www.semanticscholar.org/paper/da6f4417f8790161100f002d02970b351323647d
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In Atomic and Molecular Physics, and Optics
- Andrew J. Fleming
- Brian J. Kenton
- Kam K. Leang
- Philipp J. Thurner
- Georg Schitter
- Paul K. Hansma
- Kimberly L. Turner
- S. O. Reza Moheimani
In Electrical and Electronic Engineering
Citations in the corpus
- Design and Modeling of a High-Speed AFM-Scanner (2007, background): “Some efforts have been made to speed up imaging by using smaller and faster force sensors [10], [11] and directly actuated cantilevers [12], [13], by improving the mechanical design of the scanner [14]–[16], by exploiting alternative scanning methods [17], and by utilizing advanced control methods…”
- Nanopositioning System With Force Feedback for High-Performance Tracking and Vibration Control (2010, methodology): “In applications where the frequency of driving signals should be maximized, for example, in highspeed atomic force microscopy [12]–[15], the nanopositioner is”
- Design and input-shaping control of a novel scanner for high-speed atomic force microscopy (2008, background): “A recent paper [16] shows a design that is based on shear piezos to perform the scanning motion, which is a very elegant solution for high-speed STM but limits applications for AFM imaging due to its small scan range.”
- Design and Control of a Three-Axis Serial-Kinematic High-Bandwidth Nanopositioner (2012, background): “Shear piezos because of their geometry have high mechanical resonances [8].”