Iron detection in crystalline silicon by carrier lifetime measurements for arbitrary injection and doping

By D. Macdonald, L. J. Geerligs, A. Azzizi. 2004

240 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/d05d264efb6d8f14b2a608a10ac7d3fde3658a02

How researchers see this paper

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In Electrical and Electronic Engineering

1. R. Falster
2. V. Voronkov
3. K. Bothe

Citations in the corpus

• Minority carrier lifetime in silicon photovoltaics: The effect of oxygen precipitation (2014, methodology): “The two lifetime measurements are then analysed to give the concentration of iron that exists in FeB pairs using an established method [30,40,42].”