A Baseline for Few-Shot Image Classification

By Guneet Singh Dhillon, Pratik Chaudhari, Avinash Ravichandran, Stefano Soatto. 2019

646 citations recorded by the source corpus.

Fine-tuning a deep network trained with the standard cross-entropy loss is a strong baseline for few-shot learning. When fine-tuned transductively, this outperforms the current state-of-the-art on standard datasets such as Mini-ImageNet, Tiered-ImageNet, CIFAR-FS and FC-100 with the same hyper-parameters. The simplicity of this approach enables us to demonstrate the first few-shot learning results on the ImageNet-21k dataset. We find that using a large number of meta-training classes results in high few-shot accuracies even for a large number of few-shot classes. We do not advocate our approach as the solution for few-shot learning, but simply use the results to highlight limitations of current benchmarks and few-shot protocols. We perform extensive studies on benchmark datasets to propose a metric that quantifies the "hardness" of a few-shot episode. This metric can be used to report the performance of few-shot algorithms in a more systematic way.

Subfields: Artificial Intelligence, Computer Vision and Pattern Recognition, Representation & Self-Supervised Learning

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In Artificial Intelligence

  1. Trevor Darrell
  2. Bernt Schiele
  3. Luc Van Gool
  4. Han-Jia Ye
  5. Dacheng Tao
  6. Jiashi Feng
  7. Chunhua Shen
  8. De-chuan Zhan

In Computer Vision and Pattern Recognition

  1. Luc Van Gool
  2. Dacheng Tao
  3. Trevor Darrell
  4. Xiaogang Wang
  5. Bernt Schiele
  6. Ming-Hsuan Yang
  7. Jitendra Malik
  8. Andrew Zisserman

In Representation & Self-Supervised Learning

  1. Trevor Darrell
  2. Mingsheng Long
  3. Kate Saenko
  4. Stefano Soatto
  5. Yoshua Bengio
  6. Phillip Isola
  7. Han-Jia Ye
  8. Hakan Bilen

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