Rethinking Few-Shot Image Classification: a Good Embedding Is All You Need?

By Yonglong Tian, Yue Wang, Dilip Krishnan, Josh Tenenbaum, Phillip Isola. 2020

1,074 citations recorded by the source corpus.

The focus of recent meta-learning research has been on the development of learning algorithms that can quickly adapt to test time tasks with limited data and low computational cost. Few-shot learning is widely used as one of the standard benchmarks in meta-learning. In this work, we show that a simple baseline: learning a supervised or self-supervised representation on the meta-training set, followed by training a linear classifier on top of this representation, outperforms state-of-the-art few-shot learning methods. An additional boost can be achieved through the use of self-distillation. This demonstrates that using a good learned embedding model can be more effective than sophisticated meta-learning algorithms. We believe that our findings motivate a rethinking of few-shot image classification benchmarks and the associated role of meta-learning algorithms. Code is available at: this http URL.

Subfields: Artificial Intelligence, Computer Vision and Pattern Recognition, Representation & Self-Supervised Learning

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In Artificial Intelligence

  1. Trevor Darrell
  2. Sergey Levine
  3. Mohit Bansal
  4. Jianfeng Gao
  5. Bernt Schiele
  6. Dacheng Tao
  7. Quoc V. Le
  8. Jiashi Feng

In Computer Vision and Pattern Recognition

  1. Luc Van Gool
  2. Dacheng Tao
  3. Ming-Hsuan Yang
  4. Trevor Darrell
  5. Xiaogang Wang
  6. Andrew Zisserman
  7. Bernt Schiele
  8. Jitendra Malik

In Representation & Self-Supervised Learning

  1. Trevor Darrell
  2. Andrew Zisserman
  3. Zeynep Akata
  4. Jiashi Feng
  5. Bernt Schiele
  6. Andrea Vedaldi
  7. Hakan Bilen
  8. Chen Change Loy

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