LEEP: A New Measure to Evaluate Transferability of Learned Representations

By Cuong V Nguyen, Tal Hassner, Cédric Archambeau, Matthias W. Seeger. 2020

295 citations recorded by the source corpus.

We introduce a new measure to evaluate the transferability of representations learned by classifiers. Our measure, the Log Expected Empirical Prediction (LEEP), is simple and easy to compute: when given a classifier trained on a source data set, it only requires running the target data set through this classifier once. We analyze the properties of LEEP theoretically and demonstrate its effectiveness empirically. Our analysis shows that LEEP can predict the performance and convergence speed of both transfer and meta-transfer learning methods, even for small or imbalanced data. Moreover, LEEP outperforms recently proposed transferability measures such as negative conditional entropy and H scores. Notably, when transferring from ImageNet to CIFAR100, LEEP can achieve up to 30% improvement compared to the best competing method in terms of the correlations with actual transfer accuracy.

Subfields: Artificial Intelligence, Computer Vision and Pattern Recognition, Radiology, Nuclear Medicine and Imaging

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In Artificial Intelligence

  1. Mingsheng Long
  2. Jianmin Wang
  3. Dongrui Wu
  4. Zhangjie Cao
  5. Jonas Pfeiffer
  6. Iryna Gurevych
  7. Cédric Archambeau
  8. Martin Wistuba

In Computer Vision and Pattern Recognition

  1. Mingsheng Long
  2. Jianmin Wang
  3. Zhangjie Cao
  4. Jonas Pfeiffer
  5. Iryna Gurevych
  6. Martin Wistuba
  7. Dongrui Wu
  8. Jiashi Feng

In Radiology, Nuclear Medicine and Imaging

  1. Mingsheng Long
  2. Jianmin Wang
  3. B. Ermiş
  4. Martin Wistuba
  5. Giovanni Zappella
  6. Aditya Rawal
  7. Dongrui Wu
  8. Qiang Yang

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