High-Resolution X-Ray Scattering

By U. Pietsch, V. Holý, Tilo Baumbach. 2004

346 citations recorded by the source corpus.

Subfields: Materials Chemistry, Surfaces, Coatings and Films

View Paper: https://www.semanticscholar.org/paper/bd343d049882d33d856eed0cd7c7ee7eda935360

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Materials Chemistry

1. Uwe Schroeder
2. Thomas Mikolajick
3. Vincent Garcia
4. Manuel Bibes
5. I. Fina
6. J. MacManus‐Driscoll
7. M. Lira-Cantú
8. B. Dkhil

Citations in the corpus

• Towards Oxide Electronics: a Roadmap (2019, methodology): “Another technique used to obtain the strain gradient or, more precisely, the variation of cell parameters on sample depth is X-ray diffraction using grazing incidence geometry [196,199].”