On the Properties of the Intrinsic Point Defects in Silicon: A Perspective from Crystal Growth and Wafer Processing

By R. Falster, V. Voronkov, F. Quast. 2000

193 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/bd1a8632cbf7133e3b988b2e2e0405a5626165ad