Active damping of the scanner for high-speed atomic force microscopy
By N. Kodera, Hayato Yamashita, T. Ando. 2005
182 citations recorded by the source corpus.
Subfields: Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering
View Paper: https://www.semanticscholar.org/paper/a9b0988ed1822ddaab5677850e35771874639e86
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In Atomic and Molecular Physics, and Optics
In Electrical and Electronic Engineering
Citations in the corpus
- A New Method for Robust Damping and Tracking Control of Scanning Probe Microscope Positioning Stages (2010, background): “including receding horizon control, have also been proposed (see [23], [24]).”
- Design, Identification, and Control of a Flexure-Based XY Stage for Fast Nanoscale Positioning (2009, background): “that impart substantial damping to the system have been formulated and documented over the years [22]–[24].”