Impact of Graphene Interface Quality on Contact Resistance and RF Device Performance

By A. Hsu, Han Wang, Ki Kang Kim, Jing Kong, Tomás Palacios. IEEE Electron Device Letters, 2011

153 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Materials Chemistry

View Paper: https://www.semanticscholar.org/paper/8c41cc708bdf782d054efe9a6a59615454155123

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Electrical and Electronic Engineering

1. Filippo Giubileo
2. A. Di Bartolomeo

In Materials Chemistry

1. Filippo Giubileo
2. A. Di Bartolomeo

Citations in the corpus

• The role of contact resistance in graphene field-effect devices (2017, methodology): “5/45/15) E-Beam CVD 2p/4p 200÷500 Al cap layer [143] Ti/Pd/Au (1.”