Small-scale patterning methods for digital image correlation under scanning electron microscopy

160 citations recorded by the source corpus.

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

Digital Image Correlation under Scanning Electron Microscopy: Methodology and Validation (2013, background): “Applying a small-scale tracking pattern, for example in a 50μm x 50μm or smaller field of view (FOV), is particularly difficult; because this has been addressed in recent work by the authors [9, 10] it will not be discussed here.”
Incipient slip and long range plastic strain localization in microtextured Ti-6Al-4V titanium (2016, methodology): “The parameters were selected to limit SEM distortions while maximizing the horizontal field width (HFW), discussed in more detail elsewhere for SEM DIC [17,22], with conditions shown to be optimal in prior work [16,23].”
Self-Assembled Nanoparticle Surface Patterning for Improved Digital Image Correlation in a Scanning Electron Microscope (2013, unknown): “Existing techniques include photolithography [3, 5], thin film ablation [6], electron-beam (e-beam) lithography [7-9] and nanoparticles [7, 10, 11].”