Scanning Force Microscopy

By Holger Schönherr. 2004

216 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Biomedical Engineering, Surfaces, Coatings and Films

View Paper: https://www.semanticscholar.org/paper/71ecfcc22644463ae75ed4801781cbac27545063

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In Atomic and Molecular Physics, and Optics

In Biomedical Engineering

In Surfaces, Coatings and Films

Citations in the corpus

SOLID LIPID NANOPARTICLES: A REVIEW (2017, unknown): “The aftereffects of normal Partical size and polydispersity record were gotten from instrumental based computation system [29].”
Solid Lipid Nanoparticles: A Modern Formulation Approach in Drug Delivery System (2009, methodology): “Electron microscopy[37]: SEM and TEM provide a way to directly observe nanoparticles, physical characterization of nanoparticles with the former method being better for morphological examination.”
Strong mechanical driving of a single electron spin (2015, background): “For a singly clamped cantilever k = Ewt 3 4l3 [40], with Youngs modulus E, cantilever width w, thickness t, and length l.”
Imaging mechanism of piezoresponse force microscopy of ferroelectric surfaces (2002, background): “41 One of the difﬁculties in a comparison of the relative magnitudes of electromechanical and electrostatic responses is the difference in the contrast transfer mechanism.”
Force measurements with the atomic force microscope: Technique, interpretation and applications (2005, background): “External vibrations, such as vibrations of the building, the table, or noise, which are usually in the low frequency regime, are less transmitted to the cantilever, when the resonance frequency of the cantilever [36,37]”
Optomechanical uncooled infrared imaging system: design, microfabrication, and performance (2002, result): “Hence, the design provides larger , and at the same time has higher spatial resolution compared to the one discussed above.”
Design and Modeling of a High-Speed AFM-Scanner (2007, background): “I. INTRODUCTION THE ATOMIC force microscope (AFM) [1] is a very im-portant instrument for exploring materials at the scale of a few nanometers [2].”
Advances in atomic force microscopy (2003, methodology): “…was employed to build cantilevers in 1More information about tip-sample forces can be found in Ciraci et al. (1990); Israelachvili (1991); Sarid (1994); Perez et al. (1997, 1998); Shluger et al. (1997, 1999); Abdurixit et al. (1999); Drakova (2001); Ke et al. (2001, 2002); Tobik et al.…”