Advances in atomic force microscopy

By F. Giessibl. 2003

1,926 citations recorded by the source corpus.

This article reviews the progress of atomic force microscopy in ultrahigh vacuum, starting with its invention and covering most of the recent developments. Today, dynamic force microscopy allows us to image surfaces of conductors and insulators in vacuum with atomic resolution. The most widely used technique for atomic-resolution force microscopy in vacuum is frequency-modulation atomic force microscopy (FM-AFM). This technique, as well as other dynamic methods, is explained in detail in this article. In the last few years many groups have expanded the empirical knowledge and deepened our theoretical understanding of frequency-modulation atomic force microscopy. Consequently spatial resolution and ease of use have been increased dramatically. Vacuum atomic force microscopy opens up new classes of experiments, ranging from imaging of insulators with true atomic resolution to the measurement of forces between individual atoms.

Subfields: Atomic and Molecular Physics, and Optics, Biomedical Engineering

View Paper: https://www.semanticscholar.org/paper/aa4ec0d0fc243b9f0aeaa7ecf8288c117593a9eb

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In Atomic and Molecular Physics, and Optics

In Biomedical Engineering

Citations in the corpus

Nanostructured surfaces: challenges and frontiers in nanotechnology (2004, neutral): “Thus, a new frontier in nanoscience is being able to image the surface structure of insulators with atomic resolution (Giessibl 1995, 2003, Giessibl et al 2000, Hofer et al 2003).”
Growth of Epitaxial Graphene: Theory and Experiment (2014, background): “Depending on the tip-surface working distance AFM is characterized by different mechanical behaviors, which define different AFM operation modes [67].”
Protocols for the Optimal Design of Multi‐Functional Cellular Structures: From Hypersonics to Micro‐Architected Materials (2011, background): “Although extreme force and deﬂection resolutions are possible, 1,130 – 132 the force range is small, on the order of a few pico-Newtons, with a vertical distance resolution smaller than ~ 0.1 nm.”
Surface nanobubbles and nanodroplets (2015, background): “Several earlier review articles have explained in detail the principles and applications of AFM imaging (Garcia and Perez, 2002), force measurements (Cappella and Dietler, 1999; Butt, Cappella, and Kappl, 2005), AFM in vacuum (Giessibl, 2003), and theories of SPM (Hofer, Foster, and Shluger, 2003).”
Single-molecule imaging by optical absorption (2011, methodology): “One of the promises of our methodology lies in surface science, where single-atom sensitivity has only been achieved using scanning probe microscop”