Grain boundary mediated leakage current in polycrystalline HfO2 films

By K. McKenna, Alexander L. Shluger, V. Iglesias, M. Porti, M. Nafría, Mario Lanza, Gennadi Bersuker. 2011

147 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/6f20e0717f0fc6d858bd3e8408e76bd0ef65a0ed