Novel gate-recessed vertical InAs/GaSb TFETs with record high ION of 180 μA/μm at VDS = 0.5 V

By Guangle Zhou, Rui Li, T. Vasen, M. Qi, S. Chae, Yeqing Lu, Qin Zhang, Haijun Zhu, J. Kuo, T. Kosel and 4 more. International Electron Devices Meeting, 2012

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Subfields: Biomedical Engineering, Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/6c59674567f9859a83b17aadc4a63730885ffaa0

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In Electrical and Electronic Engineering

  1. Zhaonian Yang

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