Statistical timing analysis for intra-die process variations with spatial correlations

By Aseem Agarwal, David T. Blaauw, V. Zolotov. ICCAD-2003. International Conference on Computer Aided Design (IEEE Cat. No.03CH37486), 2003

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View Paper: https://www.semanticscholar.org/paper/64ead805f335fbd7182f4177de260fc16c8615b7

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