Magnetic resonance force microscopy

By D. Mounce. IEEE Instrumentation & Measurement Magazine, 2005

148 citations recorded by the source corpus.

View Paper: https://www.semanticscholar.org/paper/616a9f58b47d4aa1792f40b0911362c46df92066

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

1. S. O. Reza Moheimani
2. Santosh Devasia
3. Evangelos Eleftheriou
4. Paul L. McEuen
5. Stav Zaitsev
6. Oleg Shtempluck
7. V. Sazonova
8. Oded Gottlieb

Citations in the corpus

• A tunable carbon nanotube electromechanical oscillator (2004, methodology): “Using equations (1) and (3) above, this corresponds to a motion of ,0.”
• A Survey of Control Issues in Nanopositioning (2007, background): “Moreover, many new variants of SPM exist that allow the measurement of local chemical, mechanical (frictional), electric, and magnetic properties of a surface (e.g., [14], [42], [43]).”
• Nonlinear damping in a micromechanical oscillator (2009, background): “Some key applications of microelectromechanical systems (MEMS) technology include magnetic resonance force microscopy (MRFM) [5, 6] and mass-sensing [7–10].”