Atomic-scale imaging of nanoengineered oxygen vacancy profiles in SrTiO3

By D. Muller, N. Nakagawa, A. Ohtomo, J. Grazul, H. Hwang. Nature, 2004

612 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Materials Chemistry

View Paper: https://www.semanticscholar.org/paper/5f047c5e7cdccbb10b399c6693188b5f1fbb8a1a

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Electrical and Electronic Engineering

1. Uwe Schroeder
2. Thomas Mikolajick
3. I. Fina
4. Vincent Garcia
5. J. MacManus‐Driscoll
6. M. Lira-Cantú
7. B. Dkhil
8. G. Niklasson

In Materials Chemistry

1. Uwe Schroeder
2. Thomas Mikolajick
3. Vincent Garcia
4. Manuel Bibes
5. I. Fina
6. J. MacManus‐Driscoll
7. M. Lira-Cantú
8. B. Dkhil

Citations in the corpus

• Towards Oxide Electronics: a Roadmap (2019, background): “At these high levels conventional defect spectroscopies often suffer from broadening or saturation problems, however, direct observation by aberration corrected electron microscopy methods and detection of the resulting in-gap states by photoemission spectroscopies, becomes feasible [226,228,251].”