Characterizing size-dependent effective elastic modulus of silicon nanocantilevers using electrostatic pull-in instability
By H. Sadeghian, C. K. Yang, J. Goosen, E. V. D. Drift, A. Bossche, P. French, Fred van Keulen. 2009
159 citations recorded by the source corpus.
Subfields: Atomic and Molecular Physics, and Optics, Biomedical Engineering
View Paper: https://www.semanticscholar.org/paper/5484a08a404fd7c4180197eb8c1ab0930cae62fa
How researchers see this paper
The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.
In Atomic and Molecular Physics, and Optics
- Stephan Sylvest Keller
- Silvan Schmid
- Maria Tenje
- Søren Dohn
- S. Forest
- Nicolás Cordero
- Anja Boisen
- E. Busso
In Biomedical Engineering
- E. Busso
- Nicolás Cordero
- S. Forest
- Leong Hien Poh
- Elias C. Aifantis
- Luca Placidi
- Patrizio Neff
- Fadi Aldakheel
Citations in the corpus
- Cantilever-like micromechanical sensors (2011, methodology): “The same model of Eeff has also been used by Sadeghian et al to describe Young’s modulus reduction for silicon nanocantilevers [254].”
- Second strain gradient elasticity of nano-objects (2016, methodology): “In particular, their size-dependent elastic properties are studied experimentally using various methods (see, for example, Agrawal et al., 2008; McDowell et al., 2008; Sadeghian et al., 2009).”
- Buckling-induced smart applications: recent advances and trends (2015, unknown): “For example, Sadeghian et al [175] experi-”
- What is the Young's Modulus of Silicon? (2010, unknown): “See, for example, [19]–[21].”