Micro- and Nanoscale Deformation Measurement of Surface and Internal Planes via Digital Image Correlation

By T. Berfield, J. Patel, Robert G. Shimmin, P. Braun, John Lambros, Nancy R. Sottos. 2007

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Small-scale patterning methods for digital image correlation under scanning electron microscopy (2011, methodology): “SEM-DIC patterning methods that have been previously investigated by others include nanoparticle (NP) techniques [25], chemical vapor thin film rearrangement [26] and patterning of polymeric substrates through the use of a contact lithography method [27].”
Self-Assembled Nanoparticle Surface Patterning for Improved Digital Image Correlation in a Scanning Electron Microscope (2013, unknown): “Existing techniques include photolithography [3, 5], thin film ablation [6], electron-beam (e-beam) lithography [7-9] and nanoparticles [7, 10, 11].”
High-Speed Photography and Digital Optical Measurement Techniques for Geomaterials: Fundamentals and Applications (2017, methodology): “Since the sensitivity is adjustable, the DIC method can be used across a variety of length scales from massive systems such as glaciers (Haug et al. 2010) to micro- or nanoscale deformation (Berfield et al. 2007).”