Atomic force microscope cantilevers for combined thermomechanical data writing and reading

By William P. King, Thomas W. Kenny, Kenneth E. Goodson, G. Cross, M. Despont, U. Dürig, H. Rothuizen, G. Binnig, P. Vettiger. 2001

172 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/4886655e255c7be68937dabc93f1d5f9fa458456

Citations in the corpus

• Electrical, Thermal, and Mechanical Characterization of Silicon Microcantilever Heaters (2006, unknown): “With the cantilever dimensions and temperature-dependent resistivities, the cantilever electrical resistance depends on the cantilever temperature solely in the heater region to within 10% [9], [28]–[30].”