A new control strategy for high-speed atomic force microscopy
By Georg Schitter, Frank Allgöwer, A. Stemmer. 2003
152 citations recorded by the source corpus.
Subfields: Atomic and Molecular Physics, and Optics, Control and Systems Engineering
View Paper: https://www.semanticscholar.org/paper/47899e76f8b7bde4a85453ef52726ec7afc06f4b
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In Atomic and Molecular Physics, and Optics
In Control and Systems Engineering
Citations in the corpus
- Modeling and Control of Piezo-Actuated Nanopositioning Stages: A Survey (2016, methodology): “In this sense, the input and output data of the piezo-actuated stages can be directly used to obtain the linear dynamics models using the commercial dynamic signal analyzer [52], [123], the system identification toolbox in MATLAB [2], [51], [124], the weighted iterative least square fitting techniqu”
- Feedback for physicists: A tutorial essay on control (2005, background): “In a recent paper, Schitter et al. 2004 use the fact that in many SPM images one scan line resembles its neighbor.”
- Dynamic Mass Density and Acoustic Metamaterials (2007, background): “For example, the change in frequencies of anti-resonances can be an indicator of structural damages [15, 16]; it is also an element that needs to be taken into account in the design and modeling of the cantilever for atomic force microscopes [17–19].”