An embedded device technology based on a molded reconfigured wafer
By M. Brunnbauer, Edward Fürgut, G. Beer, Thorsten Meyer, H. Hedler, J. Belonio, E. Nomura, K. Kiuchi, K. Kobayashi. Electronic Components and Technology Conference, 2006
168 citations recorded by the source corpus.
Subfields: Electrical and Electronic Engineering
View Paper: https://www.semanticscholar.org/paper/38e5a86c90b122e2e2c48f6c9f4cb9a966c02a67
How researchers see this paper
The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.
In Electrical and Electronic Engineering
Citations in the corpus
- Millimeter-Wave Technology for Automotive Radar Sensors in the 77 GHz Frequency Band (2012, background): “The authors would like to thank Infineon for providing the millimeter-wave integrated circuits.”
- Warpage and Thermal Characterization of Fan-Out Wafer-Level Packaging (2017, background): “I. INTRODUCTION THE first fan-out wafer-level packaging (FOWLP) U.S.patent was filed by Infineon on October 31, 2001 [1], [2], and the first technical papers were also published (at ECTC2006 and EPTC2006) by Infineon and their industry partners: Nagase, Nitto Denko, and Yamada [3], [4].”