Low-noise silicon avalanche photodiodes fabricated in conventional CMOS technologies

By A. Rochas, A. Pauchard, P. Besse, D. Pantic, Z. Prijić, R. Popovic. 2002

166 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Instrumentation

View Paper: https://www.semanticscholar.org/paper/2c2e8c7a295f974f19935a4f99f06a4f54d60b40

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In Electrical and Electronic Engineering

1. Gerald S. Buller

In Instrumentation

1. Gerald S. Buller

Citations in the corpus

• First fully integrated 2-D array of single-photon detectors in standard CMOS technology (2003, background): “Besides the drawbacks of such hybrid solutions, detrimental optical crosstalks between pixels have been reported.”
• Fully Integrated Single Photon Avalanche Diode Detector in Standard CMOS 0.18- $\mu$m Technology (2008, methodology): “In [23], several silicon avalanche photodiodes (SAPDs) were fabricated in 0.”