A Bias-Dependent Single-Event Compact Model Implemented Into BSIM4 and a 90 nm CMOS Process Design Kit

By J. Kauppila, A. Sternberg, M. Alles, A. Francis, Jim Holmes, O. Amusan, Lloyd W. Massengill. IEEE Transactions on Nuclear Science, 2009

160 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Hardware and Architecture

View Paper: https://www.semanticscholar.org/paper/266fc9ea9fd78675eaee4462f487982e25046e26

How researchers see this paper

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In Electrical and Electronic Engineering

1. Pascale Gouker
2. Véronique Ferlet-Cavrois
3. Lloyd W. Massengill

In Hardware and Architecture

1. Pascale Gouker
2. Véronique Ferlet-Cavrois
3. Lloyd W. Massengill

Citations in the corpus

• Single Event Transients in Digital CMOS—A Review (2013, methodology): “In the 2000’s, mixed-mode modeling became an indispensable tool for the analysis of SET generation [116]–[118], as shown in Fig.”