On-line junction temperature measurement of IGBTs based on temperature sensitive electrical parameters
By H. Kuhn, A. Mertens. EPE, 2009
135 citations recorded by the source corpus.
View Paper: https://www.semanticscholar.org/paper/169626f554609da028b8699cd78f6e981b7d512b
How researchers see this paper
The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.
- Yvan Avenas
- Zoubir Khatir
- Laurent Dupont
- Nick Baker
- Haoze Luo
- Enes Ugur
Citations in the corpus
- Temperature Measurement of Power Semiconductor Devices by Thermo-Sensitive Electrical Parameters—A Review (2012, background): “A first TSEP is thus the turn-ON delay [42], [53], [54].”