The influence of visible light on transparent zinc tin oxide thin film transistors
By P. Görrn, M. Lehnhardt, Thomas Riedl, Wolfgang Kowalsky. 2007
152 citations recorded by the source corpus.
Subfields: Electrical and Electronic Engineering, Materials Chemistry, Polymers and Plastics
View Paper: https://www.semanticscholar.org/paper/12b61af71829955f6706a19177e3f397534fdd68
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In Electrical and Electronic Engineering
In Materials Chemistry
In Polymers and Plastics
Citations in the corpus
- Electrical and Photosensitive Characteristics of a-IGZO TFTs Related to Oxygen Vacancy (2011, background): “[3] has verified that the transient of the Vth recovery and the decrease in conductivity shows a similarity.”
- Instabilities in Amorphous Oxide Semiconductor Thin-Film Transistors (2010, background): “been shown to have an impact on negative bias stressing [27], [58].”
- Comparative Study on Light-Induced Bias Stress Instability of IGZO Transistors With $\hbox{SiN}_{x}$ and $ \hbox{SiO}_{2}$ Gate Dielectrics (2010, background): “for the practical application of flat panel displays [14].”