Instabilities in Amorphous Oxide Semiconductor Thin-Film Transistors

By John F. Conley. IEEE transactions on device and materials reliability, 2010

216 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Materials Chemistry

View Paper: https://www.semanticscholar.org/paper/f66de40896ed5749e6004c2d134e52950db1ee55