An MOS transistor model for RF IC design valid in all regions of operation
By Christian C. Enz. 2002
182 citations recorded by the source corpus.
Subfields: Electrical and Electronic Engineering
View Paper: https://www.semanticscholar.org/paper/105c2d83ff8484a2a64d1f7464248f2b57cfd36b
How researchers see this paper
The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.
In Electrical and Electronic Engineering
- Eric A. Vittoz
- Christian C. Enz
- M. J. Deen
- Yuhua Cheng
- Chih-Hung Chen
- Robert W. Brodersen
- Ali M. Niknejad
- Sohrab Emami
Citations in the corpus
- Charge-Based MOS Transistor Modeling: The EKV Model for Low-Power and RF IC Design (2006, methodology): “Similar results have been obtained for other operating points and other device geometries using the same scalable model [48, 49, 52].”
- MOSFET modeling for RF IC design (2005, background): “Another mechanism which might generate the induced gate noise is through the inversion charge variation caused by the substrate noise [55] via the bulk transconductance .”
- Design considerations for 60 GHz CMOS radios (2004, background): “Conventional RF CMOS transistor models [ 7 ] are based on a compact model, such as BSIM3, with external parasitics to model the substrate and gate resistance.”
- Millimeter-wave CMOS design (2005, background): “As mentioned, is limited by resistive losses, the most significant being the gate resistance , series source/drain resistances , nonquasi-static channel resistance , and resistive substrate network ( , and ) [10].”