Fundamentals Of Modern Vlsi Devices

By S. Thalberg. 2016

584 citations recorded by the source corpus.

View Paper: https://www.semanticscholar.org/paper/1008cc798537aef30c1e4e567d76f2cd558be392

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

1. F. Palumbo
2. Chao Wen
3. Fei Hui
4. S. Pazos
5. Mario Lanza
6. S. Lombardo
7. F. Aguirre
8. M. Eizenberg

Citations in the corpus

• A Review on Dielectric Breakdown in Thin Dielectrics: Silicon Dioxide, High‐k, and Layered Dielectrics (2019, methodology): “Other manufacturing parameters like annealing temperature also show a profound effect on the BD statistics.[3,48]”