In-situ tensile testing of nano-scale specimens in SEM and TEM

By M. Aman Haque, M. Saif. 2002

281 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, Mechanics of Materials

View Paper: https://www.semanticscholar.org/paper/0bdb9bb855617d49495a645750ee6f6523218a98

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Atomic and Molecular Physics, and Optics

1. Richard E. Thompson
2. J. Pulskamp
3. Ronald Polcawich
4. William N. Sharpe
5. Chris Eberl
6. D. Gianola

In Mechanics of Materials

1. William N. Sharpe
2. D. Gianola
3. Qianbing Zhang
4. Jian Zhao

Citations in the corpus

• Strain Measurements of Silicon Dioxide Microspecimens by Digital Imaging Processing (2006, background): “A third approach integrates the specimen with a load frame, which can be attached to a translation stage to extend it, and conducts the test inside an SEM [13].”