The effect of moisture on the photon-enhanced negative bias thermal instability in Ga-In-Zn-O thin film transistors

By K. Lee, J. Jung, K. Son, Joonsuk Park, Tae Sang Kim, R. Choi, Jae Kyeong Jeong, Jang Yeon Kwon, Bon-won Koo, Sangyoon Lee. 2009

281 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/0238a9e2102098ba91aed5e1b529579992f89dfd

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Electrical and Electronic Engineering

1. Jae Kyeong Jeong
2. John F. Conley
3. Y. Mo
4. Jang Yeon Kwon
5. Hideo Hosono
6. T. Kamiya

Citations in the corpus

• Instabilities in Amorphous Oxide Semiconductor Thin-Film Transistors (2010, background): “[10] subjected SiNx dielectric/IGZO SBG TFTs to negative bias current stressing with VG = −20 V and VDS = +10 V at 60 ◦C while under illumination from a halogen lamp.”
• Comparative Study on Light-Induced Bias Stress Instability of IGZO Transistors With $\hbox{SiN}_{x}$ and $ \hbox{SiO}_{2}$ Gate Dielectrics (2010, background): “In this regard, there have been several reports, including the effect of moisture [5], device”