The band excitation method in scanning probe microscopy for rapid mapping of energy dissipation on the nanoscale

By Stephen Jesse, Sergei V. Kalinin, Roger Proksch, A. Baddorf, B. Rodriguez. 2007

391 citations recorded by the source corpus.

Mapping energy transformation pathways and dissipation on the nanoscale and understanding the role of local structure in dissipative behavior is a key challenge for imaging in areas ranging from electronics and information technologies to efficient energy production. Here we develop a family of novel scanning probe microscopy (SPM) techniques in which the cantilever is excited and the response is recorded over a band of frequencies simultaneously, rather than at a single frequency as in conventional SPMs. This band excitation (BE) SPM allows very rapid acquisition of the full frequency response at each point (i.e. transfer function) in an image and in particular enables the direct measurement of energy dissipation through the determination of the Q-factor of the cantilever–sample system. The BE method is demonstrated for force–distance and voltage spectroscopies and for magnetic dissipation imaging with sensitivity close to the thermomechanical limit. The applicability of BE for various SPMs is analyzed, and the method is expected to be universally applicable to ambient and liquid SPMs.

Subfields: Atomic and Molecular Physics, and Optics

View Paper: https://www.semanticscholar.org/paper/fe2c1b1844a3f9fbf8de9738a7bb8f3c80efc207

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In Atomic and Molecular Physics, and Optics

1. Qi Yu
2. Yunseok Kim
3. Jiangyue Li
4. Bora Kim
5. Q. Chen
6. Jing-Feng Li
7. Daehee Seol
8. S. Xie

Citations in the corpus

• Strain-based scanning probe microscopies for functional materials, biological structures, and electrochemical systems (2015, background): “Another technique is based on band excitation (BE) [24].”
• Non-piezoelectric effects in piezoresponse force microscopy (2017, background): “These techniques, which include dual ac resonance tracking (DART)[66, 67] and band excitation (BE),[68, 69] significantly enhance the signal-to-noise ratio of the observed PFM response, which facilitates the achievement of vertical (z-height) resolutions at the picometer level.”