Non-piezoelectric effects in piezoresponse force microscopy
By Daehee Seol, Bora Kim, Yunseok Kim. 2017
152 citations recorded by the source corpus.
Abstract Piezoresponse force microscopy (PFM) has been used extensively for exploring nanoscale ferro/piezoelectric phenomena over the past two decades. The imaging mechanism of PFM is based on the detection of the electromechanical (EM) response induced by the inverse piezoelectric effect through the cantilever dynamics of an atomic force microscopy. However, several non-piezoelectric effects can induce additional contributions to the EM response, which often lead to a misinterpretation of the measured PFM response. This review aims to summarize the non-piezoelectric origins of the EM response that impair the interpretation of PFM measurements. We primarily discuss two major non-piezoelectric origins, namely, the electrostatic effect and electrochemical strain. Several approaches for differentiating the ferroelectric contribution from the EM response are also discussed. The review suggests a fundamental guideline for the proper utilization of the PFM technique, as well as for achieving a reasonable interpretation of observed PFM responses.
Subfields: Atomic and Molecular Physics, and Optics, Biomedical Engineering, Materials Chemistry
View Paper: https://www.semanticscholar.org/paper/a63b00b406806a21e03ef6eccae83eaac80d31e5
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In Biomedical Engineering
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Citations in the corpus
- Two-dimensional materials with piezoelectric and ferroelectric functionalities (2018, background): “However, many non-ferroelectric materials could also show similar behaviors due to the coulombic electrostatic interaction between the AFM tip/cantilever and the charged sample surface, or the electrical driven ion accumulation/depletion induced sample deformation.(47,48) These effects can be largel”