First-principles study of native point defects in hafnia and zirconia

By J. Zheng, Gerbrand Ceder, T. Maxisch, W. Chim, W. Choi. 2007

182 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Materials Chemistry

View Paper: https://www.semanticscholar.org/paper/fac8e9ca8b2c8412ddedc1bdf6a541005ff2778a

Citations in the corpus

• Electronic properties of hafnium oxide: A contribution from defects and traps (2016, unknown): “The obtained result is consistent with the data obtained in [42].”