Electronic properties of hafnium oxide: A contribution from defects and traps

By Vladimir Gritsenko, T. Perevalov, D. Islamov. 2016

189 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/2fbabc55ae24ded858744b4f9974c598c647838d