Deformation potential constants of biaxially tensile stressed Ge epitaxial films on Si ( 100 )

By Jifeng Liu, D. D. Cannon, K. Wada, Y. Ishikawa, D. T. Danielson, S. Jongthammanurak, Jürgen Michel, Lionel C. Kimerling. 2004

151 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering, Surfaces, Coatings and Films

View Paper: https://www.semanticscholar.org/paper/f96c7f5d8a22446cc63dc68972cb63a2b08a8f77

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Atomic and Molecular Physics, and Optics

1. Jifeng Liu
2. Lionel C. Kimerling
3. Xiaochen Sun

In Electrical and Electronic Engineering

1. Xiaochen Sun
2. Jifeng Liu
3. Lionel C. Kimerling

Citations in the corpus

• Toward a Germanium Laser for Integrated Silicon Photonics (2010, methodology): “deformation potential data used in this calculation are adopted from [11] and [12].”