Compositional heterogeneity in NIST SRM 610-617 glasses

By S. Eggins, J. Shelley. 2002

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In situ analysis of major and trace elements of anhydrous minerals by LA-ICP-MS without applying an internal standard (2008, background): “Moreover, some compositional heterogeneities have been shown to affect at least twenty four of the doped trace elements in the NIST glasses (Hinton,1999; Eggins and Shelley, 2002).”
Rutile crystals as potential trace element and isotope mineral standards for microanalysis (2009, methodology): “Homogeneity tests and accurate trace element measurements have been performedon glass standards (NIST SRM610-617:Hinton (1999); Eggins and Shelley (2002); SRM 614-617: Horn et al.”
Determination of Multiple Trace Element Compositions in Thin (> 30 μm) Layers of NIST SRM 614 and 616 Using Laser Ablation‐Inductively Coupled Plasma‐Mass Spectrometry (LA‐ICP‐MS) (2005, methodology): “Eggins and Shelley (2002) carefully examined compositional heterogeneity of many trace elements in NIST SRM glasses and concluded that all NIST SRM 610-617 wafers contain domains that are significantly depleted in Ag, As, Au, B, Bi, Cd, Cr, Cs, Mo, Pb, Re, Sb, Se, Te, Tl and W within individual…”
Determination of Reference Values for NIST SRM 610–617 Glasses Following ISO Guidelines (2011, methodology): “As already noted by Eggins and Shelley (2002), some elements, such as Tl and Au, are strongly depleted in the rims.”