Determination of Multiple Trace Element Compositions in Thin (> 30 μm) Layers of NIST SRM 614 and 616 Using Laser Ablation‐Inductively Coupled Plasma‐Mass Spectrometry (LA‐ICP‐MS)

By T. Morishita, Y. Ishida, S. Arai, M. Shirasaka. 2005

143 citations recorded by the source corpus.

Subfields: Artificial Intelligence, Geophysics, Pollution

View Paper: https://www.semanticscholar.org/paper/1dd5af6963dea66315f1c347ee109a2c57e29c9d