Modeling CMOS tunneling currents through ultrathin gate oxide due to conduction- and valence-band electron and hole tunneling

By Wen-Chin Lee, Chenming Calvin Hu. 2001

352 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/f4f8a3aabff5dd3b1f6171ba7a575a287c970093