High performance solution-processed amorphous zinc tin oxide thin film transistor
By Seok-Jun Seo, C. Choi, Y. Hwang, B. Bae. 2009
251 citations recorded by the source corpus.
Subfields: Electrical and Electronic Engineering, Polymers and Plastics
View Paper: https://www.semanticscholar.org/paper/f4d10ba767cb8857b9358983c02879362c8f188b
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In Electrical and Electronic Engineering
In Polymers and Plastics
Citations in the corpus
- Instabilities in Amorphous Oxide Semiconductor Thin-Film Transistors (2010, methodology): “Gornn et al. [27] reported a negative VT shift, with S degradation for ALD ATO dielectric/ZTO SBG TFTs but only for some compositions of ZTO.”