Radiation-induced multi-bit upsets in SRAM-based FPGAs
By H. Quinn, P. Graham, J. Krone, M. Caffrey, S. Rezgui. IEEE Transactions on Nuclear Science, 2005
168 citations recorded by the source corpus.
Subfields: Electrical and Electronic Engineering, Hardware and Architecture
View Paper: https://www.semanticscholar.org/paper/e5124b951d5c3cd666185a2c9f8494b435618352
How researchers see this paper
The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.
- P. Ostler
- B. Pratt
- K. Morgan
- Derrick Gibelyou
- M. Wirthlin
- Paul Graham
- Heather M. Quinn
- M. Caffrey
Citations in the corpus
- SRAM FPGA Reliability Analysis for Harsh Radiation Environments (2009, background): “, more than one upset from a single charged particle [16], [17].”