SRAM FPGA Reliability Analysis for Harsh Radiation Environments

By P. Ostler, M. Caffrey, Derrick Gibelyou, Paul Graham, K. Morgan, B. Pratt, Heather M. Quinn, M. Wirthlin. IEEE Transactions on Nuclear Science, 2009

140 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Hardware and Architecture

View Paper: https://www.semanticscholar.org/paper/23117024ed32038e4cda8e2954d9ace7a553a200