OPMISR: the foundation for compressed ATPG vectors

By C. Barnhart, Vanessa Brunkhorst, Frank Distler, Owen Farnsworth, B. Keller, Bernd Könemann, A. Ferko. Proceedings International Test Conference 2001 (Cat. No.01CH37260), 2001

353 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Hardware and Architecture

View Paper: https://www.semanticscholar.org/paper/e445f7dd921b646f25f85b217146b0be96f7d3ac

How researchers see this paper

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1. J. Rajski
2. J. Tyszer
3. M. Kassab
4. N. Mukherjee

Citations in the corpus

• Embedded deterministic test (2004, methodology): “Decrease of test data along with a 2 scan test-time reduction is also accomplished in the scheme based on the on-product MISR [1], [ 18 ].”