Line broadening analysis using integral breadth methods: a critical review

By P. Scardi, M. Leoni, R. Delhez. 2004

338 citations recorded by the source corpus.

Subfields: Materials Chemistry, Mechanical Engineering, Mechanics of Materials

View Paper: https://www.semanticscholar.org/paper/e2d2bec2aeb45dd0c457a3df7499ba5b112173b1

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Materials Chemistry

1. T. Ungár
2. G. Tichy
3. Ralph Jörg Hellmig
4. J. Gubicza
5. S. Sivasankaran
6. R. Narayanasamy

In Mechanical Engineering

1. T. Ungár
2. R. Narayanasamy
3. J. Gubicza

In Mechanics of Materials

1. S. Sivasankaran
2. T. Ungár
3. J. Gubicza

Citations in the corpus

• The “state of the art” of the diffraction analysis of crystallite size and lattice strain (2008, neutral): “[20, 21] and references therein).”
• Correlation between subgrains and coherently scattering domains (2005, methodology): “The size distribution provided by the fitting procedure is in perfect agreement with the bar diagram obtained by evaluating the TEM micrographs Langford et al., 2000; Scardi et al., 2004; Balzar et al., 2004 .”
• X-ray peak broadening analysis of AA 6061100 − x − x wt.% Al2O3 nanocomposite prepared by mechanical alloying (2011, methodology): “Integral breadth methods for line profile analysis of XRDpeaks are frequentlyused tomeasure the average size of the crystallite and lattice strain (microstrain or lattice distortions) due to the presence of lattice defects [6].”