The “state of the art” of the diffraction analysis of crystallite size and lattice strain
By E. J. Mittemeijer, U. Welzel. 2008
325 citations recorded by the source corpus.
Subfields: Ceramics and Composites, Geophysics, Materials Chemistry
View Paper: https://www.semanticscholar.org/paper/d8acdd2069969fce0bc402e621bd14b31405c951
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In Ceramics and Composites
In Geophysics
In Materials Chemistry
Citations in the corpus
- Metrological characterization of X-ray diffraction methods at different acquisition geometries for determination of crystallite size in nano-scale materials (2013, methodology): “[38] Mittemeijer EJ, Welzel U.”
- Improved cellulose X-ray diffraction analysis using Fourier series modeling (2020, methodology): “Three analytical concepts are adopted to calculate cellulose CI with XRD data (Mittemeijer and Welzel 2008): peak intensity analysis such as peak height method, line profile decomposition such as peak decomposition or deconvolution (Lanson 1997; Park et al. 2010; Ahvenainen et al. 2016), and line…”