Deposition and modification of titanium dioxide thin films by filtered arc deposition

By A. Bendavid, P. Martin, H. Takikawa. 2000

203 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Materials Chemistry, Mechanics of Materials

View Paper: https://www.semanticscholar.org/paper/e24c56fd1ccffcbe3380a7b04c68544943b0c33e

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In Electrical and Electronic Engineering

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In Materials Chemistry

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In Mechanics of Materials

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Citations in the corpus

• Single-material TiO2 double-layer antireflection coatings (2003, methodology): “The linear variation of the refractive index (measured at 550 nm) with density is shown in Figure 8 for films deposited by five different techniques [39].”
• Comparison of TiO2 and other dielectric coatings for buried‐contact solar cells: a review (2004, methodology): “While it is difficult to determine film density via non-destructive testing, an accurate estimate of can be obtained from measuring the refractive index, as a linear relationship exists between and n.(92,100)”